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2002-2008, Schroeder Measurement Technologies, Inc. All Rights Reserved |
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| © 2002-2008, Schroeder Measurement Technologies, Inc. All Rights Reserved | |
| Resources > Information Sheets • Articles • Links
Click on an article or presentation title to download the pdf file (requires the free Adobe Acrobat Reader©) Developing
a Certification or Licensure Exam Reed Castle, Ph.D., SMT
Director of Research and Development. Exam Security (a short overview that first appeared in the Fall 2004 issue of Dimensions). Introduction
to Item Response Theory (Part of a presentation at 2002
NOCA Conference), Reed Castle, Ph.D., SMT Director of Research and Development. Introduction
to Job Analysis (Part of a presentation at 2003 CLEAR Conference),
Reed Castle, Ph.D., SMT Director of Research and Development. Navigating the Basics of Test Scores A Layman's Guide to Testing Terminology Algorithmically-Derived Examination Specifications Reed Castle, Ph.D., SMT Director of Research and Development. The Development of Cut Scores Reed Castle, Ph.D., SMT Director of Research and Development.
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